Materials Characterization

High-resolution imaging, elemental analysis, and electrochemical characterization of materials and devices, backed by former Sandia National Laboratories staff.

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FE-SEM image of ordered nanowire clusters grown in anodized-alumina templates, fabricated in-house

FE-SEM · Secondary electron

EDS · Elemental · IllustrativekeV

Scan70%

InstrumentHitachi S-4800

01Overview

Imaging, analysis, and testing to the nanometer scale

VastVision takes on characterization task orders and focused studies, from a single campaign to full development support. We pair national-laboratory instrumentation with the experience to interpret it, so you get answers, not just data.

SEM image of a released magnetostrictive MEMS resonator at 130x magnification

02Capabilities

Imaging & Elemental Analysis

Field-emission electron microscopy with elemental analysis for materials and devices.

Hitachi S-4800 field-emission scanning electron microscope
Energy-dispersive X-ray spectroscopy (EDS)
High-resolution imaging to the nanometer scale
Elemental composition and failure analysis

Electrochemistry & Controlled Processing

Electrochemical characterization and controlled-atmosphere materials processing.

Voltalab Radiometer PGZ-100 potentiostat workstation
Electrochemical deposition, characterization, and analysis
Inert-atmosphere glove box for air-sensitive materials
High-temperature tube furnace and vacuum oven for thermal processing

More lab services

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Need materials answered? Scope a study with us.

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